N-Channel 800W 900V Power Mosfet To252 Package Osg80r900df

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Shanghai Winture Electric Co., Ltd.

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OSG80R900DF To252-1
Refrigerator
2010+
Discrete Device
Element Semiconductor
ST
SMD
Analog Digital Composite and Function
N-Type Semiconductor
LED Lighting
EV Charger
Osg80r900df
To252
Orientalsemi
Orientalsemi
Carton
35x30x37cm
China
8541290000
Product Description
Product Description

General Description
The GreenMOS®  high voltage MOSFET utilizes charge balance technology to achieve outstanding low on-resistance and lower gate charge.  It is engineered to minimize conduction loss, provide superior switching performance and robust avalanche capability.
The  GreenMOS®   Generic  series  is  optimized  for  extreme  switching  performance  to  minimize switching  loss.  It  is  tailored for  high  power  density applications  to  meet the  highest  efficiency standards.

Features
. Low RDS(ON) & FOM
. Extremely low switching loss
. Excellent stability and uniformity

Applications
. PC power
. LED lighting
. Telecom power
.  Server power
. EV Charger
.  Solar/UPS

Key Performance Parameters
 

ParameterValueUnit
VDS, min @ Tj(max)850V
ID, pulse15A
RDS(ON) , max @ VGS=10V900
Qg11.7nC

Marking Information
 
Product NamePackageMarking
OSG80R900DFTO252OSG80R900D

 

Absolute Maximum Ratings at Tj=25°C unless otherwise noted

 
ParameterSymbolValueUnit
Drain-source voltageVDS800V
Gate-source voltageVGS±30V
Continuous drain current1) , TC=25 °C
ID
5
A
Continuous drain current1) , TC=100 °C3.2
Pulsed drain current2) , TC=25 °CID, pulse15A
Continuous diode forward current1) , TC=25 °CIS5A
Diode pulsed current2) , TC=25 °CIS, pulse15A
Power dissipation3) , TC=25 °CPD63W
Single pulsed avalanche energy5)EAS160mJ
MOSFET dv/dt ruggedness, VDS=0…640 Vdv/dt50V/ns
Reverse diode dv/dt, VDS=0…640 V, ISDIDdv/dt15V/ns
Operation and storage temperatureTstg, Tj-55 to 150°C

Thermal Characteristics

 
ParameterSymbolValueUnit
Thermal resistance, junction-caseRθJC2°C/W
Thermal resistance, junction-ambient4)RθJA62°C/W

Electrical Characteristics at Tj=25°C unless otherwise specified
 
ParameterSymbolMin.Typ.Max.UnitTest condition
Drain-source
breakdown voltage

BVDSS
800  
V
VGS=0 V, ID=250 μA
850  VGS=0 V, ID=250 μA, Tj=150 °C
Gate threshold
voltage
VGS(th)2.9 3.9VVDS=VGS , ID=250 μA
Drain-source on- state resistance
RDS(ON)
 0.80.9
Ω
VGS=10 V, ID=2.5 A
 2.1 VGS=10 V, ID=2.5 A, Tj=150 °C
Gate-source
leakage current

IGSS
  100
nA
VGS=30 V
  - 100VGS=-30 V
Drain-source
leakage current
IDSS  1μAVDS=800 V, VGS=0 V


Dynamic Characteristics
 
ParameterSymbolMin.Typ.Max.UnitTest condition
Input capacitanceCiss 647.4 pF
VGS=0 V,
VDS=50 V,
ƒ=100 kHz
Output capacitanceCoss 36.1 pF
Reverse transfer capacitanceCrss 1.5 pF
Turn-on delay timetd(on) 31.3 ns
VGS=10 V,
VDS=400 V,
RG=2 Ω,
ID=4 A
Rise timetr 16.4 ns
Turn-off delay timetd(off) 54.6 ns
Fall timetf 7.0 ns

Gate Charge Characteristics
 
ParameterSymbolMin.Typ.Max.UnitTest condition
Total gate chargeQg 11.7 nC
VGS=10 V,
VDS=400 V,
ID=4 A
Gate-source chargeQgs 2.8 nC
Gate-drain chargeQgd 4.4 nC
Gate plateau voltageVplateau 5.8 V

Body Diode Characteristics
 
ParameterSymbolMin.Typ.Max.UnitTest condition
Diode forward voltageVSD  1.3VIS=5 A,
VGS=0 V
Reverse recovery timetrr 216.5 nsVR =400 V,
IS=4 A,
di/dt=100 A/μs
Reverse recovery chargeQrr 1.9 μC
Peak reverse recovery currentIrrm 17.0 A


Note
1)   Calculated continuous current based on maximum allowable junction temperature. 2)   Repetitive rating; pulse width limited by max. junction temperature.
3)   Pd is based on max. junction temperature, using junction-case thermal resistance.
4)   The value of RθJA  is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with Ta=25 °C.
5)   VDD=100 V, VGS=10 V, L=60 mH, starting Tj=25 °C.








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