The uncooled infrared focal plane detector is suitable for long-wave infrared imaging. This detector is made from a vanadium oxide microbolometer focal plane array chip, integrated onto a CMOS readout circuit and sealed in a high-vacuum package.
VOx microbolometerLow power consumption:<170mW
TEC-less
High sensitivity: NETD<40 m
Thermal time constant:<12ms
RoHS-compliant lead-free package
Items | Specification | |||
Sensor | Vanadium oxide microbolometer | |||
Spectral range | 8-14μm | |||
Pixel pitch | 12μm | |||
Array size | 656×522(Comprehensive array)640×512(effect array) | |||
Digital output bit depth | 14bits | |||
Readout mode | Line-by-line readout | |||
Mirroring function | X-direction and Y-direction mirroring | |||
Output polarity | Hot white | |||
Operability rate | 299.5% | |||
Non-uniformity correction function | On-chip 6-bit non-uniformity correction | |||
Frame rate | 60Hz | |||
Working temperature | -40ºC-+85ºC | |||
C | CH | M | Unit | |
Thermal time constant | c10 | c12 | c10 | ms |
NETD(f/1.0,50Hz,300K) | G40 | c40 | C40 | m K |
Power consumption(50Hz.25ºC,without TEC) | c170 | c170 | c170 | mW |
Temperature measurement range(f/1.0) | -40~600 | -40-600 | -40-600 | ºC |
Focal plane array (FPA) definition
The output focal plane array of the RTD6122 detector is shown in Figure 1. The output focal plane array consists of 522 rows and 656 columns, where rows 8 to 519 and columns 10 to 649 form the effective array. Column 654 is the DTEMP column, and column 655 is the TEST column.

Photoelectric performance
Xi'an Zhongke Lead IR-Tech Co., Ltd established in 2015, is a Research type enteprise based on intelligent electro-optical equipment and infrared thermal imaging technology, incubated by Xi'an Institute of Optics and Precision Mechanics of China Academy of Sciences.
Lead IR-Tech has three core centers: Photoelectric equipment integration, precision optical processing, and specialized lens calibration. They are equipped with over 400 advanced devices, including CNC polishing machines, photoelectric, coordinate measuring machines, interferometers, and photoelectric system testing systems. This enables LEAD IR-TECH to achieve the full process of design, processing, integration, and testing of photoelectric products.