Product Specifications
RAY-OC116#
Temperature Measurment & Optics Applying
All
All
Silicon Wafer Substrate
Monocrystalline Silicon
+-2% @10.6um
0/-0.15mm
+/-0.05mm
2-5um @ Tave Less Than 1%; 5.5-14um @Tave More Tha
Less Than 1 Arc Min
60-40 Scratch-Dig
Optoelectronic Semiconductor
Element Semiconductor
Customize as Per Demand
Analog Digital Composite and Function
as Per Demand
as Per Demand
Raytek
Raytek
100PCS Per Carton
custom as per demand
China
281122900